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发明名称
SEMICONDUCTOR MEMORY DEVICE HAVING OPEN BIT LINE ARCHITECTURE AND METHOD FOR SCREENING FAIL CELL THEREOF
摘要
申请公布号
KR20060084104(A)
申请公布日期
2006.07.24
申请号
KR20050004118
申请日期
2005.01.17
申请人
HYNIX SEMICONDUCTOR INC.
发明人
CHOI, HONG SOK
分类号
G11C7/18
主分类号
G11C7/18
代理机构
代理人
主权项
地址
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