| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device capable of minimizing a decrease in data processing performance in preventing the malfunction of a circuit due to voltage drop. <P>SOLUTION: The semiconductor device is equipped with a plurality of function blocks 102, 103 each having a voltage drop detection circuit, a current suppressing circuit connected to the voltage drop detection circuit, and a data processing part for processing data. Any voltage drop is detected in units of the function blocks and the data processing part is controlled in such a manner that for a local voltage drop, the amount of circuit operation per unit time processed by the data processing part in units of the function blocks is reduced. Since voltage drops are detected locally and the speed of data processing is reduced with respect to the function block corresponding to a location where a voltage drop has been detected, it is made possible to prevent malfunction due to voltage drops and a decrease in the processing performance of the entire semiconductor device can be reduced by control of the local data processing speed. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p> |
