发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To accelerate response to the change of voltage of a source/drain electrode. <P>SOLUTION: An LDMOS transistor is provided with a second conductive first well region (3) formed in a first conductive semiconductor substrate (2), a first conductive second well region (4) formed in the first well region, a second conductive third well region (5) formed in the second well region, a drain region (6) formed in the second well region, a source region (8) formed in the third well region, a gate electrode (10) formed on the third well region between the drain region and the source region through a gate insulating film and an insulating layer (11) formed between the gate electrode and the drain region. A parasitic capacity between the semiconductor substrate and the source region as well as a parasitic capacity between the semiconductor substrate and the drain region are series parasitic capacity respectively, which are seen so as to be small relatively whereby the delay of response to the change of voltage of the drain (source), which follows the change of voltage of the source (drain), becomes comparatively small. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006120818(A) 申请公布日期 2006.05.11
申请号 JP20040306473 申请日期 2004.10.21
申请人 RENESAS TECHNOLOGY CORP 发明人 HITANI MITSUHARU;NAGASAWA TOSHIO;TAMURA AKIHIRO
分类号 H01L27/08;H01L21/822;H01L21/8238;H01L27/04;H01L27/092;H01L29/78;H02M3/155 主分类号 H01L27/08
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