| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a laminated semiconductor device having a favorable signal quality by structuring such that a test stub wiring is separated from a main signal wiring during normal operation. <P>SOLUTION: The provision of a switching transistor, a selector, a fuse, or a connector brings the test stub wiring into conduction during testing, and out of conduction during normal operation, thus maintaining signal quality of the signal wiring. In addition, the provision of the selector in which the ratio between the signal wire and the test stub wiring is N:1 enables obtaining a laminated semiconductor device in which the number of test signal pins is reduced. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
