发明名称 Method for fabricating semiconductor device
摘要 After the implantation of fluorine ions into a semiconductor substrate, a gate insulating film, a gate electrode and a protective film are formed on the semiconductor substrate. Thereafter, fluorine ions are again implanted into the semiconductor substrate. Furthermore, p-type source/drain extension regions and source/drain regions are formed in the semiconductor substrate.
申请公布号 US2006099748(A1) 申请公布日期 2006.05.11
申请号 US20050265102 申请日期 2005.11.03
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 SATOU YOSHIHIRO
分类号 H01L21/84 主分类号 H01L21/84
代理机构 代理人
主权项
地址