发明名称 |
Asymmetrical layout structure for ESD protection |
摘要 |
A semiconductor structure for electrostatic discharge protection is presented. The semiconductor structure comprises a grounded gate nMOS (GGNMOS) having a substrate, a gate electrode, a source region and a drain region. A plurality of contact plugs is formed on the source and drain side. A plurality of first level vias is electrically coupled to the GGNMOS and has a substantially asymmetrical layout in the source and drain regions. A second level via(s) re-routes the ESD current to the desired first level vias. The uniformity of the current flow in the GGNMOS is improved.
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申请公布号 |
US2006097330(A1) |
申请公布日期 |
2006.05.11 |
申请号 |
US20040985532 |
申请日期 |
2004.11.10 |
申请人 |
YU KUO-FENG;LEE JIAN-HSING;SHIH JIAW-REN;YANG FU C |
发明人 |
YU KUO-FENG;LEE JIAN-HSING;SHIH JIAW-REN;YANG FU C. |
分类号 |
H01L29/76 |
主分类号 |
H01L29/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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