发明名称 SURFACE ROUGHNESS/CONTOUR MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide a surface roughness/contour measuring instrument moving relatively a probe and a workpiece within an orthogonal XY-plane, by a relatively inexpensive constitution. SOLUTION: The probes 6, 7 of the surface roughness/contour measuring instrument 1 are connected to a driving part 4 for driving the probes 6, 7 along a prescribed one direction, by a connection member 8 moving the probes 6, 7 along the prescribed one direction with respect to the driving part 4. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006118911(A) 申请公布日期 2006.05.11
申请号 JP20040305253 申请日期 2004.10.20
申请人 TOKYO SEIMITSU CO LTD 发明人 YANAI NOBUYUKI;KUBOTA KAZUHIRO
分类号 G01B21/20;G01B21/30 主分类号 G01B21/20
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