| 摘要 |
PROBLEM TO BE SOLVED: To provide a circuit board inspection device capable of reducing inspection period with a simple constitution while keeping high reliability for the inspection. SOLUTION: This circuit board inspection device comprises a probe 4 for inspection brought into contact with a conductor pattern 21 formed on a circuit board P to be inspected; a measuring section 5 for measuring the electrostatic capacity C1 between the probe 4 for inspection in contact with the conductor pattern 21 and a reference electrode 2b; and a discriminating section for comparing the measured electrostatic capacity C1 with a reference electrostatic capacity as reference data for discriminating the contact previously made to correspond to the conductor pattern 21 and discriminating the contact state of the probe 4 for inspection with the conductor pattern 21 based on the comparison result. The right and wrong of the conductor pattern 21 is inspected, based on the measured electrostatic capacity C1. COPYRIGHT: (C)2006,JPO&NCIPI
|
