发明名称 APPARATUS AND METHOD OF PLASMA PROCESSING
摘要 <P>PROBLEM TO BE SOLVED: To provide an apparatus and a method of plasma processing which can restrict an electron shading effect and is configured as a damage-free wafer processing without making ion or electron of high energy. <P>SOLUTION: The apparatus of plasma processing includes a plasma generator 100, a wafer processor 200 in which a wafer 15 to be processed is arranged, a metal grid 22 for separating the plasma generator and the wafer processor, an upper electrode 21 arranged in the plasma generator and having a porous silicon layer 27 for emitting electron, a gas introducing unit for introducing gas, and a gas introducing port for introducing a process gas. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006114614(A) 申请公布日期 2006.04.27
申请号 JP20040298825 申请日期 2004.10.13
申请人 CANON ANELVA CORP 发明人 SNIL WIKURAMANAYAKA
分类号 H01L21/205;C23C16/509;H01L21/3065;H05H1/24;H05H1/46 主分类号 H01L21/205
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