发明名称 Semiconductor device and semiconductor device manufacturing method
摘要 A technique is provided which enables formation of nitride semiconductor layers with excellent flatness and excellent crystallinity on a gallium nitride substrate (GaN substrate), while improving the producibility of the semiconductor device using the GaN substrate. A gallium nitride substrate is prepared which has an upper surface having an off-angle of not less than 0.1° nor more than 1.0° in a <1-100> direction, with respect to a (0001) plane. Then, a plurality of nitride semiconductor layers including an n-type semiconductor layer are stacked on the upper surface of the gallium nitride substrate to form a semiconductor device such as a semiconductor laser.
申请公布号 US2006086948(A1) 申请公布日期 2006.04.27
申请号 US20050252734 申请日期 2005.10.19
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 OHNO AKIHITO;TAKEMI MASAYOSHI;TOMITA NOBUYUKI
分类号 H01L21/00;H01L33/16;H01L33/32 主分类号 H01L21/00
代理机构 代理人
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