发明名称 Optical bench for a mass spectrometer system
摘要 Mass spectrometer systems for measuring mass/charge ratios of analytes are described. A mass spectrometer system includes a vacuum flange, a PCB base plate coupled to the vacuum flange, and an ion optic assembly coupled to the PCB base plate. The PCB base plate may include signal-processing electronics. The system may include an electrical cable coupled to the PCB base plate for supplying power, control, and I/O to the ion optic assembly and the signal processing electronics. Alternatively, a mass spectrometer system includes a PCB base plate and an ion optic assembly. The PCB base plate has a sealant portion and an electrical portion. The ion optic assembly is coupled to the electrical portion. The system may include a vacuum housing for enclosing the ion optic assembly. The vacuum housing is coupled to the sealant portion of the PCB base plate for sustaining a vacuum while the system is in operation.
申请公布号 US7442920(B2) 申请公布日期 2008.10.28
申请号 US20050205758 申请日期 2005.08.16
申请人 O. I. CORPORATION 发明人 SCHEIDEMANN ADI A.;MCGRAW MARK S.;LONG CLARE R.;KIBELKA GOTTFRIED P.
分类号 B01D59/44 主分类号 B01D59/44
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