发明名称 APPARATUS FOR FABRICATING SEMICONDUCTOR AND METHOD FOR FABRICATING SEMICONDUCTOR USING THE SAME
摘要 <p>A semiconductor manufacturing apparatus and a semiconductor manufacturing method using the same are provided to increase productivity and reliability by preventing contamination of a lithography unit due to residues. A coating unit forms a coating layer on a wafer. A lithography unit exposes and develops a photoresist layer. A scrubbing unit is formed in an inline method on a track between the coating unit and the lithography unit. The scrubbing unit includes an up/down pin(120) for supporting the wager and moving upwardly/downwardly the wafer, a rotation chuck(130) for rotating the wafer to be directed to a front surface or a rear surface of the wafer, a cylinder(140) for moving upwardly/downwardly the rotation chuck, and a RF generator(150) and a cleaning nozzle(160) for cleaning the wafer.</p>
申请公布号 KR20080084065(A) 申请公布日期 2008.09.19
申请号 KR20070025183 申请日期 2007.03.14
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, HUN ROK;KUM, KYOUNG SOO
分类号 H01L21/304;H01L21/027 主分类号 H01L21/304
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