发明名称 METHOD FOR FORMING SIC SINGLE CRYSTAL
摘要 A method of growing SiC single crystal is provided to improve a quality of the SiC crystal and lower carrier density and micropipe density by periodically introducing hydrogen to a growth furnace. A seed(20) with an SiC epitaxial layer formed on a surface is prepared. After the seed and a source are loaded in a furnace(10), the furnace is mounted in a growth furnace(50). The growth furnace is maintained in a vacuum, and then SiC single crystal is grown by repeatedly introducing and stopping a gas containing hydrogen. The growth furnace is cooled. The SiC epitaxial layer is formed under pressure of 30 to 70 mbar at a temperature of 200 °C.
申请公布号 KR100845946(B1) 申请公布日期 2008.07.11
申请号 KR20070002698 申请日期 2007.01.10
申请人 DONG-EUI UNIVERSITY INDUSTRY-ACADEMIC COOPERATIONFOUNDATION 发明人 SHIN, BYOUNG CHUL;LEE, WON JAE;GIM, IL SU;KU, KAP RYEOL
分类号 C30B29/36;C30B23/00 主分类号 C30B29/36
代理机构 代理人
主权项
地址