发明名称 |
METHOD FOR FORMING SIC SINGLE CRYSTAL |
摘要 |
A method of growing SiC single crystal is provided to improve a quality of the SiC crystal and lower carrier density and micropipe density by periodically introducing hydrogen to a growth furnace. A seed(20) with an SiC epitaxial layer formed on a surface is prepared. After the seed and a source are loaded in a furnace(10), the furnace is mounted in a growth furnace(50). The growth furnace is maintained in a vacuum, and then SiC single crystal is grown by repeatedly introducing and stopping a gas containing hydrogen. The growth furnace is cooled. The SiC epitaxial layer is formed under pressure of 30 to 70 mbar at a temperature of 200 °C.
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申请公布号 |
KR100845946(B1) |
申请公布日期 |
2008.07.11 |
申请号 |
KR20070002698 |
申请日期 |
2007.01.10 |
申请人 |
DONG-EUI UNIVERSITY INDUSTRY-ACADEMIC COOPERATIONFOUNDATION |
发明人 |
SHIN, BYOUNG CHUL;LEE, WON JAE;GIM, IL SU;KU, KAP RYEOL |
分类号 |
C30B29/36;C30B23/00 |
主分类号 |
C30B29/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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