| 摘要 |
An internal voltage monitoring circuit of a semiconductor memory apparatus is provided to perform an internal voltage test without wire bonding during the internal voltage test. A voltage divider part(100) outputs at least one divided voltage by dividing an internal voltage. A code detector set(200) performs digital coding of an output of the voltage divider part. A test driving part drives the voltage divider part during test driving. The code detector set includes a code detector for each divided voltage. Each code detector outputs a high or low digital code according to an output level of the voltage divider part. |
