| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit allowing high-speed readout without error by suppressing increase in a peak current of a circuit without increasing read operation time. <P>SOLUTION: The semiconductor integrated circuit includes a fuse cell array 10-1 storing initialization information, a plurality of fuse readout circuits 20 connected to the fuse cell array, for reading the initialization information, and a readout control circuit 30 controlling the plurality of fuse readout circuits 20. When a power supply is turned on, the readout control circuit 30 generates readout activation signal SAACTB0-n having a prescribed delay time interval so that timings of the current peaks generated for the respective fuse readout circuits 20 are different from one another in the readout operations of the plurality of fuse readout circuits 20. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
