发明名称 |
Repairing integrated circuit memory arrays |
摘要 |
A memory array 2 has an address decoder 12 responsive to a repair signal to operate either in a normal mode or a repair mode. In the normal mode a data bit is stored within a single memory cell 6 . In the repair mode a data bit is stored within multiple memory cells 6 of a common column of memory cells sharing bit lines 8 . This provides increased defect resistance when operating in the repair mode at the cost of reduced memory capacity.
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申请公布号 |
US2008165609(A1) |
申请公布日期 |
2008.07.10 |
申请号 |
US20070650568 |
申请日期 |
2007.01.08 |
申请人 |
MITTAL ANURAG;KWON JUNGTAE |
发明人 |
MITTAL ANURAG;KWON JUNGTAE |
分类号 |
G11C8/12;G11C8/00 |
主分类号 |
G11C8/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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