发明名称 METHOD OF FORMING SOURCE AND DRAIN OF FIELD-EFFECT-TRANSISTOR AND STRUCTURE THEREOF
摘要 Embodiments of the invention provide a method of forming a field-effect-transistor (FET). The method includes implanting one or more n-type dopants to create one or more implanted regions with at least a portion of the implanted regions being designated as regions for forming source and drain extensions of the FET; activating the implanted regions; etching with a chlorine based etchant to create openings in the implanted regions, and forming the source and drain extensions by exptaxially growing embedded silicon germanium in the openings. Structure of a semiconductor field-effect-transistor made thereof is also provided.
申请公布号 US2008166847(A1) 申请公布日期 2008.07.10
申请号 US20070763561 申请日期 2007.06.15
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;CHARTERED SEMICONDUCTOR MANUFACTURING, LTD. 发明人 UTOMO HENRY K.;MISHRA SHAILENDRA;TEO LEE WEE;LEE JAE GON;TAN SHYUE SENG
分类号 H01L21/336 主分类号 H01L21/336
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