发明名称 METHOD AND APPARATUS FOR INSPECTING RFID TAG
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method and an apparatus for inspecting RFID (radio frequency identification) tags, which improves the inspection efficiency by locating malfunctional RFID tags by a way of shielding. <P>SOLUTION: With respect to the method and apparatus for quickly locating malfunctional RFID tags by a way of shielding, a plurality of RFID tags in a readable zone are read, and next, it is determined whether there is any malfunctional RFID tag in the plurality of RFID tags or not, and the plurality of RFID tags quickly pass when no malfunctional RFID tag exists, and malfunctional RFID tags are located by shielding one or more tags when the unreadable RFID tag exists. This method and apparatus are capable of solving improving the efficiency during inspection and simplifying the design of a readable zone. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008181477(A) 申请公布日期 2008.08.07
申请号 JP20070073556 申请日期 2007.03.20
申请人 IND TECHNOL RES INST 发明人 CHEN HUI-TA;HUANG GUO-SHING;LIN CHING-CHIH;CHANG CHUN-HAO;ZHUANG CHUAN-SHENG;KO MING-HSIEN;KAO CHIH-HUNG
分类号 G06K17/00 主分类号 G06K17/00
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