发明名称 SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a scanning probe microscope capable of exciting a cantilever in its resonance frequency to observe a sample. SOLUTION: The vibration produced in an exciting piezoelectric element 22 is transmitted to a vibration transmitting wire 18 through a wire fixing stand 19. Since the vibration transmitting wire 18 is in contact with the second surface S2 (the surface on the side of a probe 8) of the cantilever 7, the vibration transmitted to the vibration transmitting wire 18 is transmitted to the cantilever 7 from the side of the second surface S2 of the cantilever 7. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008298428(A) 申请公布日期 2008.12.11
申请号 JP20070141277 申请日期 2007.05.29
申请人 JEOL LTD 发明人 KITAMURA SHINICHI
分类号 G01Q30/14;G01Q60/32;G01Q70/00 主分类号 G01Q30/14
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