| 摘要 |
Methods and apparatus to measure a voltage on an integrated circuit are disclosed. An example method to measure a voltage on an integrated circuit provides a reference signal to a first input of an encoder, provides a signal having a first voltage to a second input of the encoder, varies the reference signal from a second voltage to a third voltage, determines a first time value associated with a change in a state of an output of the encoder during the varying of the reference signal, and measures the first voltage based on the first time value.
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