发明名称 |
HARD DISK MEDIA WITH PATTERN FOR ALIGNMENT, AND ALIGNMENT METHOD |
摘要 |
PROBLEM TO BE SOLVED: To solve the problem that it is necessary to detect the center and direction of a disk in order to correctly allign the disk to a stage upon a surface inspection in a manufacturing process of a patterned medium, but the direction of the disk can not be detected in the case of the present disk. SOLUTION: A patterned medium 1 has a bit pattern 6 consisting of convex parts 4 of a magnetic material at one side plane or both planes of a non-magnetic substrate 2 having a center hole 3. A diffraction grating pattern 20 is formed at an inner periphery (or outer periphery) of the patterned medium 1 as a pattern for alignment. The diffraction grating pattern 20 is a pattern of a repetition type, and includes a repetition pitch pattern being different from other part at at least one place on a circumference, or includes a part having no pattern. The center and the direction of the disk 1 can be detected by irradiating this diffraction grating pattern with detection light and detecting the diffracted light. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2008299912(A) |
申请公布日期 |
2008.12.11 |
申请号 |
JP20070142236 |
申请日期 |
2007.05.29 |
申请人 |
HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS BV |
发明人 |
HIROSE TAKESHI;YOSHITAKE YASUHIRO |
分类号 |
G11B5/82;G11B5/65;G11B5/84 |
主分类号 |
G11B5/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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