发明名称 PHASE MEASUREMENT APPARATUS, SKEW MEASUREMENT APPARATUS, PHASE MEASUREMENT METHOD, AND SKEW MEASUREMENT METHOD
摘要 There is provided a phase measurement apparatus for measuring a phase of a signal under measurement. The phase measurement apparatus includes a sampling section that samples the signal under measurement at timings indicated by a sampling clock supplied thereto, a jitter injecting section that injects jitter to at least one of the signal under measurement which is to be input into the sampling section and the sampling clock, and a phase calculating section that calculates the phase of the signal under measurement based on a result of the sampling performed by the sampling section.
申请公布号 US2008303509(A1) 申请公布日期 2008.12.11
申请号 US20070758676 申请日期 2007.06.06
申请人 ADVANTEST CORPORATION 发明人 ISHIDA MASAHIRO
分类号 G01R25/00 主分类号 G01R25/00
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