发明名称 METHODS AND APPARATUSES FOR NON-OPTICAL PIXEL SELF TEST
摘要 <p>Methods and apparatuses for non-optical testing of imaging devices having an array of pixels are provided. One or more pixels are tested by setting the photoconversion device and/or a floating diffusion region to a known voltage level that is different from that used to operate the pixel during non-test operation. The pixel is then sampled and compared to an expected value.</p>
申请公布号 WO2008150634(A1) 申请公布日期 2008.12.11
申请号 WO2008US63210 申请日期 2008.05.09
申请人 MICRON TECHNOLOGY, INC.;CHINNAVEERAPPAN, KALAIRAJA 发明人 CHINNAVEERAPPAN, KALAIRAJA
分类号 H04N3/15;H04N17/00 主分类号 H04N3/15
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