发明名称 |
APPARATUS FOR DETERMINING RESIDUAL IMAGE OF DISPLAY DEVICE AND METHOD FOR DETERMINING RESIDUAL IMAGE OF DISPLAY DEVICE |
摘要 |
A device for measuring after image and a method thereof are provided to check the referred gradation of the determination, when measuring an after image. A display panel for being measured is prepared(S100). A test pattern comprises a first part including a first gradation, a second part including a second gradation which is placed having a gap against the first part, and a third part which covers the first, and the second parts. The test pattern of which gradation is continuously changed is displayed to the display panel(S200). The test pattern is maintained(S300). The after image of the display panel is measured(S400). |
申请公布号 |
KR20080107779(A) |
申请公布日期 |
2008.12.11 |
申请号 |
KR20070056004 |
申请日期 |
2007.06.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
MOON, HOI SIK;JEONG, JAE WON |
分类号 |
G02F1/133;G02F1/13;G09G3/30;H04N17/00 |
主分类号 |
G02F1/133 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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