发明名称 TEST PATTERN SIGNAL GENERATION DEVICE AND METHOD, COLORIMETRY SYSTEM, AND DISPLAY DEVICE
摘要 PROBLEM TO BE SOLVED: To display a test pattern corresponding to a wide color gamut on a display part of a display device. SOLUTION: The method is applied to a case for displaying a test pattern of a color chart of specification of a first color gamut, and a test pattern of a color chart of specification of a second color gamut wider than the first color gamut on a television receiver 30. Thus, information on the color chart of the specification of the first color gamut and information of the color chart of the specification of the second color gamut are recorded. Based on the recorded information on the color charts, image signals for displaying the test pattern in which the color charts of the respective specifications arranged with a predetermined array on a same screen are generated, and the color charts are displayed on the television receiver 30 by the image signals. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008301452(A) 申请公布日期 2008.12.11
申请号 JP20070148646 申请日期 2007.06.04
申请人 SONY CORP 发明人 IMAI YUTAKA;KATO NAOYA
分类号 H04N17/02;H04N9/64 主分类号 H04N17/02
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