发明名称 |
A SEMICONDUCTOR DEVICE, A METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND A TESTING METHOD OF THE SAME |
摘要 |
A semiconductor device, a method of manufacturing a semiconductor device and a testing method of the same is provided to Integrate the second semiconductor devices selected each process. A manufacturing method of the semiconductor device is comprised of steps: forming a first semiconductor device having first memory circuit(1); performing the electrical test of the first semiconductor device and selects the good(2); forming the second semiconductor device; performing an electrical test of the second memory circuit of second semiconductor device; selecting the good and Integrating the second semiconductor device selected in the fourth process and first semiconductor device selected in the second process. |
申请公布号 |
KR20080107305(A) |
申请公布日期 |
2008.12.10 |
申请号 |
KR20080053085 |
申请日期 |
2008.06.05 |
申请人 |
RENESAS TECHNOLOGY CORP. |
发明人 |
HAMADA KANYA;TANAKA TASUKE;SEITO AKIRA;NAKAJIMA YOSHIAKI |
分类号 |
G01R31/26;G11C29/00;H01L21/82 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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