发明名称
摘要 In an accumulation mode MOSFET, a surface channel layer is disposed on a p- type base region between an n+ type source region and an n- type epi layer. The surface channel layer is composed of an n type channel layer formed on the p- type base region and a p type channel layer formed on the n type channel layer. A gate insulating film is formed on the p type channel layer. A channel is formed in the n type channel layer. Accordingly, channel mobility can be improved and on-resistance can be reduced without being affected by a state of an interface between the gate insulating film and the surface channel layer.
申请公布号 JP4192353(B2) 申请公布日期 2008.12.10
申请号 JP19990267529 申请日期 1999.09.21
申请人 发明人
分类号 H01L29/78;H01L21/04;H01L29/12;H01L29/24;H01L29/417 主分类号 H01L29/78
代理机构 代理人
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