发明名称 CAM expected address search testmode
摘要 A CAM device that performs operations on-chip during testing. The CAM device can, for example, include circuitry that compares search results with an expected address to determine whether the expected address is defective. The CAM can be tested by applying search data and the expected address to the CAM at the same time, and determining if a match occurs at the expected address. In another approach, a reset match enable is used to limit the search to only a CAM memory location that has been written to, thereby limiting the test search to only the location containing test data.
申请公布号 US7464308(B2) 申请公布日期 2008.12.09
申请号 US20040755409 申请日期 2004.01.13
申请人 MICRON TECHNOLOGY, INC. 发明人 DAMON TIM
分类号 G01R31/28;G11C29/00;G11C29/38 主分类号 G01R31/28
代理机构 代理人
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