发明名称 INSPECTION DEVICE AND INSPECTION PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide an inspection device capable of easily performing the inspection of a subject by using photographed images with high accuracy, and to provide an inspection program that makes a computer operate as such an inspection device. SOLUTION: This inspection device comprises an image getting portion 310 for getting a plurality of photographed images of the same subject different from each other in imaging times, a deformation amount calculating portion 330 for calculating the amount of deformation necessary for making two photographed images agree with each other by deforming one of the photographed images, a deformation detecting portion 370 detecting a region of the deformation on the subject with the lapse of time between two photographed images, on the basis of the amount of deformation, and a defect-detecting portion 360 that detects regions of cracks, and the like, on the subject after a lapse of time. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008292405(A) 申请公布日期 2008.12.04
申请号 JP20070140500 申请日期 2007.05.28
申请人 FUJIFILM CORP 发明人 IMAMURA TAKASHI
分类号 G01N23/04;G01B15/04;G01N21/88 主分类号 G01N23/04
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