发明名称 KARTIERUNG EINES OBERFLÄCHENPROFILS
摘要 The invention refers to an apparatus for mapping a surface profile of a surface of an object, by which the apparatus yields slope data. The slope data of the apparatus may comprise measurement errors, which according to the invention shall be detected and corrected for. It is suggested that a computational entity calculates for all measurement values the curl of the slope data for determining surface locations at which the measurement values exhibit measurement errors. In a second step the proposal is given with which the measurement values can be corrected.
申请公布号 DE602006003345(D1) 申请公布日期 2008.12.04
申请号 DE20066003345T 申请日期 2006.06.27
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 VAN AMSTEL, WILLEM D.;POTZE, WILLEM
分类号 G01B11/24;G01B11/30;G01N21/95;G06T7/00 主分类号 G01B11/24
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