| 摘要 |
A semiconductor integrated circuit is provided to control internal pressure release to prevent fail due to high voltage by monitoring high voltage in selection mode or un-selection mode. In a semiconductor integrated circuit, an end of first switch is connected to an internal power, and a second switch is connected between the other end of the first switch and a test pad. A first(30-1) and second switch control circuit(30-2) controls the first and the second switch in response to the control signal. A first switch control circuit is operated in response to internal power and the second switch control circuit is operated in response to the test pad voltage. |
