发明名称 Composition for cleaning semiconductor device
摘要 A sulfur-containing detergent composition for cleaning a semiconductor device having an aluminum wire, wherein the sulfur-containing detergent composition is capable of forming a protective film containing a sulfur atom on a surface of an aluminum film in a protective film-forming test; a semiconductor device comprising a protective film containing a sulfur atom on a surface of an aluminum wire, wherein sulfur atom is contained within a region of at least 5 nm in its thickness direction from the surface of the protective film; and method for manufacturing a semiconductor device, comprising the step of contacting an aluminum wire of the semiconductor device with the sulfur-containing detergent composition as defined above, thereby forming a sulfur-containing protective film on the surface of the aluminum wire. The semiconductor device can be suitably used in the manufacture of electronic parts such as LCD, memory and CPU. Especially, the semiconductor device is suitably used in the manufacture of a highly integrated semiconductor with advanced scale-down.
申请公布号 US2008296767(A1) 申请公布日期 2008.12.04
申请号 US20080216212 申请日期 2008.07.01
申请人 TAMURA ATSUSHI;DOI YASUHIRO 发明人 TAMURA ATSUSHI;DOI YASUHIRO
分类号 H01L21/304;H01L23/52;C11D3/02;C11D3/20;C11D3/36;C11D7/08;C11D7/26;C11D7/34;C11D7/36;C11D11/00;G03F7/42;H01L21/02;H01L21/3213 主分类号 H01L21/304
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