发明名称 Signal analysis system and calibration method
摘要 A method and apparatus adapted to calibrate a signal path of a signal analysis system such that loading effects of the system are substantially removed from measurements of a device under test. A signal under test from the device under test is coupled to a test probe in the signal path and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.
申请公布号 US7460983(B2) 申请公布日期 2008.12.02
申请号 US20060508460 申请日期 2006.08.23
申请人 TEKTRONIX, INC. 发明人 PICKERD JOHN J.;TAN KAN;HAGERUP WILLIAM A.;ANDERSON ROLF P.;MC MASTERS SHARON M.
分类号 G06F19/00;G06F17/40 主分类号 G06F19/00
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