Method and apparatus for providing context switching of logic in an integrated circuit using test scan circuitry

摘要

A method and apparatus provides context switching of logic in an integrated circuit using one or more test scan circuits that use test data during a test mode of operation of the integrated circuit to store and/or restore non-test data during normal operation of the integrated circuit. The integrated circuit includes context control logic operative to control the test scan circuit to at least one of: store and restore context state information contained in functional storage elements in response to detection of a request for a change in context during normal operation of the integrated circuit.