发明名称 SYSTEM FOR TESTING AND SORTING ELECTRONIC COMPONENTS
摘要 A sorting system is provided for electronic components such as LED devices which includes a testing station for testing and determining a characteristic of each electronic component. A first tray has a plurality of receptacles for receiving tested electronic components and a second tray has more receptacles than the first tray for receiving tested electronic components. Electronic components comprising tested characteristics that occur with greater frequency are loaded into the receptacles of the first tray and electronic components comprising tested characteristics that occur with lower frequency are loaded into the receptacles of the second tray.
申请公布号 US2008290004(A1) 申请公布日期 2008.11.27
申请号 US20070753880 申请日期 2007.05.25
申请人 TSAI PEI WEI;SZE CHAK TONG;WONG SAI KIT;YIP FONG SHING 发明人 TSAI PEI WEI;SZE CHAK TONG;WONG SAI KIT;YIP FONG SHING
分类号 B07C5/34;G06F19/00 主分类号 B07C5/34
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