发明名称 酸化物半導体ターゲットおよび酸化物半導体材料、並びにそれらを用いた半導体装置の製造方法
摘要 There are provided an oxide semiconductor material, capable of attaining stability of a threshold voltage (Vth) (threshold voltage shift amount &Dgr;Vth within a range of ±3 V in PDS and NBIS) and field-effect mobility of 5 cm2/Vs or more necessary for the operation of an OLED display device. An oxide semiconductor target in which an oxide semiconductor material with one or more of oxides of W, Ta, and Hf of 5d transition metal added each by 0.07 to 3.8 at %, 0.5 to 4.7 at %, and 0.32 to 6.4 at % to a semiconductor material with Zn—Sn—O as a main ingredient is sintered; a semiconductor channel layer formed by using the target, and an oxide semiconductor material for TFT protective film, as well as a semiconductor device having the same.
申请公布号 JP5983163(B2) 申请公布日期 2016.08.31
申请号 JP20120174692 申请日期 2012.08.07
申请人 日立金属株式会社 发明人 若菜 裕紀;内山 博幸;福島 英子
分类号 H01L21/363;G09F9/30;H01L21/336;H01L27/32;H01L29/786 主分类号 H01L21/363
代理机构 代理人
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