发明名称 Semiconductor device and method of fabrication thereof
摘要 A method includes the steps of: introducing insulation film into a trench to provide a trench isolation; planarizing the trench isolation to expose a passivation film; and removing the passivation film and depositing a second silicon layer on a first silicon layer and the trench isolation; and in the step of depositing the first silicon layer the first silicon layer is an undoped silicon layer and in the step of depositing the second silicon layer the second silicon layer is a doped silicon layer or an undoped silicon layer subsequently having an impurity introduced thereinto or the like and thermally diffused through subsequent thermal hysteresis into the first silicon layer.
申请公布号 US2008290453(A1) 申请公布日期 2008.11.27
申请号 US20080219402 申请日期 2008.07.22
申请人 RENESAS TECHNOLOGY CORP. 发明人 MORINO YASUKI;KUSAKABE YOSHIHIKO;WAKAHARA RYUICHI
分类号 H01L29/00;H01L21/00;H01L21/04;H01L21/28;H01L21/762;H01L21/8247;H01L27/115 主分类号 H01L29/00
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