发明名称 THICKNESS MEASURING INSTRUMENT AND THERMAL DIFFUSIVITY OR THERMAL CONDUCTIVITY MEASURING INSTRUMENT USING THE THICKNESS MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide a thickness measuring instrument for simply and accurately measuring the thickness-wise dimension of a measured object, the dimension being used for calculation, etc. of thermal diffusivity, with a contacting part kept in contact with the measured object perpendicularly by desired pressure contact force at all times independently of a measurer's skill. SOLUTION: When a vertically-movable body 31 is let down by rotative driving of a Z-direction drive stepping motor 39 with the measured object 8 mounted on the top face of a mounting surface 14, the contacting part 47 provided on an end of a measurement arm part 45 makes contact with the measured object 8 to upward rock the arm part 45 by reactive force with the measured object 8 sandwiched between the contacting part 47 and the mounting surface 14. Capacitance of a balance capacitor 50 provided at a portion with a horizontal shaft 44 pivotally mounted thereon is varied in accordance with the rocking motion of the arm part 45. When a measurement value reaches a domain where balance is acquired with a difference being zero, a control part 81 sends out a control signal for stopping the letting-down of the vertically-movable body 31 to the stepping motor 39. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008286563(A) 申请公布日期 2008.11.27
申请号 JP20070129956 申请日期 2007.05.16
申请人 ETOU DENKI KK 发明人 ETO TETSUTARO
分类号 G01B5/06;G01N25/18 主分类号 G01B5/06
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