发明名称 CAD CIRCUIT DIAGRAM INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To easily inspect a circuit diagram after the value of an element property is input according to the latest design rule. SOLUTION: This CAD circuit diagram inspection device is provided with a circuit diagram reading means 202 for reading a circuit diagram; an inspection rule reading means 201 for reading an inspection rule; a property acquisition means 214 for acquiring property including element characteristics information showing the characteristics of elements included in the circuit diagram read by the circuit diagram reading means and group information associating the element with the other elements; an inspection performance means 207 for performing inspection based on the inspection rule read by the inspection rule reading means 201 and the property acquired by the property acquisition means 214 about the circuit diagram read by the circuit diagram reading means 202; and a display means 208 for referring to the property of the element whose error decision has been made among the inspection results of the inspection performance means 207, and for performing error display about the pertinent element. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008287341(A) 申请公布日期 2008.11.27
申请号 JP20070129375 申请日期 2007.05.15
申请人 TOSHIBA CORP 发明人 SUSA HIDEYA
分类号 G06F17/50 主分类号 G06F17/50
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