发明名称 DISTRIBUTION CIRCUIT INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a distribution circuit inspection method capable of simply performing inspection for short circuit failure. SOLUTION: The inspection method is used for a distribution circuit 36 outputting a plurality of input signals to a plurality of output terminals 40, the input signals input into first to fourth input terminals 37a to 37d. The inspection method includes an input step of entering the input signals into the input terminals 37a to 37d to be inspected, a measurement step of measuring the amounts of electric current flowing through the input terminals 37a to 37d, and a quality determination step of determining the quality of the distribution circuit 36 from the amounts of electric current. This inspection method is characterized in that the voltage of the input signals input into the inspected input terminals in the input step is different from that of input signals input into neighboring input terminals. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008281417(A) 申请公布日期 2008.11.20
申请号 JP20070125289 申请日期 2007.05.10
申请人 SEIKO EPSON CORP 发明人 SAITO MASAYOSHI;OGUCHI TAKESHI
分类号 G01R31/02;B41J2/16 主分类号 G01R31/02
代理机构 代理人
主权项
地址
您可能感兴趣的专利