| 摘要 |
A burn-in test system of semiconductor memory device is provided to select and test a plurality of DUTs and write and fail information by using one for controlling DUT in the burn-in board. A burn-in test system of semiconductor memory device stores a test pattern data in a first test and stores fault information in a second test in response to a scan control signal. A pattern data generation unit generates a test pattern data in a first test. An interface unit receives and expands test pattern data, and generates a plurality of test pattern data in a first test and generates fail information of a plurality of semiconductor memory devices in a second test. A control unit control receives data from a plurality of semiconductor memory devices in the first test and extracts fail information of the each semiconductor memory device, and then outputs the fail information to the interface in the second test. |
