发明名称 MOS devices having elevated source/drain regions
摘要 A semiconductor structure includes a semiconductor substrate; a gate dielectric over the semiconductor substrate; a gate electrode over the gate dielectric; a deep source/drain region adjacent the gate electrode; a silicide region over the deep source/drain region; and an elevated metallized source/drain region between the silicide region and the gate electrode. The elevated metallized source/drain region adjoins the silicide region.
申请公布号 US2008277735(A1) 申请公布日期 2008.11.13
申请号 US20070800615 申请日期 2007.05.07
申请人 KO CHIH-HSIN;CHEN HUNG-WEI;KE CHUNG-HU;KUAN TA-MING;LEE WEN-CHIN 发明人 KO CHIH-HSIN;CHEN HUNG-WEI;KE CHUNG-HU;KUAN TA-MING;LEE WEN-CHIN
分类号 H01L29/417;H01L27/092;H01L29/78 主分类号 H01L29/417
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