发明名称 SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device in which a resistance value is not changed even if pressure is applied to the device by bonding. <P>SOLUTION: A first resistance element 20 formed by an n-type semiconductor and a second resistance element 22 formed by a p-type semiconductor are connected in series. A bump 18 is provided on an electrode 14 connected electrically to an integrated circuit 12. The first resistance element 20 includes a first overlapping portion 24 overlapping with the bump 18 and having a first resistance value. The second resistance element 22 includes a second overlapping portion 26 overlapping with the bump 18 and having a second resistance value. The first overlapping portion 24 has a property in which the first resistance value is lowered in proportion to a load applied thereto. The second overlapping portion 26 has a property in which the second resistance value is increased in proportion to a load applied thereto. The lowering rate of the first resistance value is x times the increase rate of the second resistance value. The first resistance value is 1/x times the second resistance value. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2008277686(A) 申请公布日期 2008.11.13
申请号 JP20070122298 申请日期 2007.05.07
申请人 SEIKO EPSON CORP 发明人 YAMAZAKI YASUO
分类号 H01L21/822;H01L21/3205;H01L23/52;H01L27/04 主分类号 H01L21/822
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