| 摘要 |
PROBLEM TO BE SOLVED: To provide a material testing machine capable of reducing temperature drifts of measurement signals. SOLUTION: An adder 2033 superposes calibrations signals SSK1 on carrier signals. A first filter 206 supplies only carrier signals for a load cell 30. A second filter 207 extracts calibration signals. Extracted calibration signals are superposed on detection signals from the load cell 30 at the adder 209. Output of the adder 209 is converted into digital signals and inputted to a measurement signal detection circuit 2034 and a calibration detection circuit 2035. The measurement signal detection circuit 2034 detects detection signals to acquire measurement detection signals SSP1, and the calibration detection circuit 2035 detects calibration signals to acquire calibration detection signals SSKP1. In a control circuit 201, measurement detection signals SSP1 are calibrated on the basis of the calibration signals SSK1 and the calibration detection signals SSKP1 to acquire post-calibration measurement signals SSF1. COPYRIGHT: (C)2009,JPO&INPIT
|
