发明名称 SURFACE MEASUREMENT APPARATUS
摘要 The precision is improved even when measuring the large area to be the superhigh speed. The surface measurement apparatus in which the measurement of three dimensional shape is possible can be provided. The light source is for irradiating the laser beam(L). A rotating reflection mirror is for irradiating the laser beam on one-way. The first optical system(214) receives the laser beam from the rotating reflection mirror and scan the measurement object. The beam(Ls) is reflected to the rotating reflection mirror. The second optical system(215) have the fixed beam path. One or more reflected beam detection unit detects the beam reflected with the rotating reflection mirror.
申请公布号 KR20080098811(A) 申请公布日期 2008.11.12
申请号 KR20070044143 申请日期 2007.05.07
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 KIM, TAK GYUM;KIM BAE KYUN;KIM, HONG KI;PARK, JUNE SIK;LEE, CHANG YUN;KANG, DONG HOON;HONG, SANG SU
分类号 H01L21/66;H01L21/00 主分类号 H01L21/66
代理机构 代理人
主权项
地址