发明名称 Semiconductor device capable of threshold voltage adjustment by applying an external voltage
摘要 A semiconductor device has a silicon substrate, in which an active region is formed between two device isolation films and a gate is formed on the surface of the active region. The silicon substrate has a laterally etched portion in the active region below the surface of the active region on the side near the device isolation film. An insulating film is formed on the laterally etched portion of the silicon substrate. A conductive electrode is formed on the insulating film, through which an external voltage is applied to adjust a threshold voltage. The device isolation film is formed on the conductive electrode. None or some pockets of vacant cavity is present between the device isolation film and the conductive electrode.
申请公布号 US7449392(B2) 申请公布日期 2008.11.11
申请号 US20070877820 申请日期 2007.10.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM YIL WOOK;CHO JUN HEE;PARK SUNG EON;AHN JIN HONG;LEE SANG DON
分类号 H01L21/76;H01L21/3065;H01L21/308;H01L21/311;H01L21/336;H01L21/762;H01L21/763;H01L21/764;H01L21/765;H01L21/8234;H01L21/8242;H01L27/02;H01L29/00;H01L29/06;H01L29/78 主分类号 H01L21/76
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