发明名称 Method for fabricating a semiconductor device for reducing a surface potential
摘要 A semiconductor device has an active region composed of a group III-V nitride semiconductor and ohmic electrodes and a gate electrode each formed on the active region. The active region has an entire surface thereof exposed to a plasma such that a surface potential for electrons therein is lower than in the case where the entire surface is not exposed to the plasma.
申请公布号 US7449399(B2) 申请公布日期 2008.11.11
申请号 US20060527695 申请日期 2006.09.27
申请人 发明人
分类号 H01L21/26 主分类号 H01L21/26
代理机构 代理人
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