| 摘要 |
An improved signal quality test system is provided to minimize the reflected wave of the input signal and improve I-window by controlling the inductance value of the memory and making a branched memory resonate at the operating frequency. In a test system(200) generating a test pattern in test operation, a test board(210), equipped with a plurality of memories which is connected through the transmission line(230) in parallel, supplies the test pattern through the transmission line to a plurality of memories. A compensation unit converts the resonant frequency of a plurality of memories(211~214) into the operating frequency and compensates for the signal distortion on the transmission line. A compensation unit reduces the reflected wave by converts the resonant frequency of a plurality of memories into the operating frequency. A reflected wave is minimized in case that resonant frequency of a plurality of memories is identical to the operating frequency. |
