发明名称 METHOD AND DEVICE FOR DETERMINING PROCESSING CONDITIONS, DISPLAY AND DISPLAYING METHOD, PROCESSOR, MEASURING INSTRUMENT AND ALIGNER, SUBSTRATE PROCESSING SYSTEM, AND PROGRAM AND INFORMATION RECORDING MEDIUM
摘要 <p>At the first step A, a transfer position measured actually by a measuring/inspecting instrument is shown by a black circle. A target transfer position shown by 5 at step B is located at the same position as that of the black circle. Assuming the weights at the subsequent steps are identical, a target transfer position Xtarget shown by 5 at each of steps C, D and E is located at a moderate position where a total deviation from an actual transfer position (black circle) measured at the step preceding that layer by the measuring/inspecting instrument is minimized, i.e. a proper position for a plurality of other steps. Consequently, productivity of a device can be enhanced.</p>
申请公布号 KR20080097994(A) 申请公布日期 2008.11.06
申请号 KR20087017092 申请日期 2007.01.26
申请人 NIKON CORPORATION 发明人 OKITA SHINICHI
分类号 H01L21/027;H01L21/02 主分类号 H01L21/027
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