| 摘要 |
PROBLEM TO BE SOLVED: To reduce a test design cost in a circuit in which an external memory can be access-controlled. SOLUTION: A semiconductor device has a built-in self-test circuit (11) used for a test of an external memory being apart from a memory controller (6) performing memory control in response to access request for the external memory (4) connected to a memory interface (8), and uses a TAP controller (12) to refer control and a test result of the built-in self-test circuit. The semiconductor device adopts a multiplexer (13) which select the memory controller or the built-in self-test circuit in a switchable manner as a circuit for connecting to the memory interface conforming to the control information input from the outside through the TAP controller. The built-in self-test circuit generates a pattern for memory test in a programmable manner conforming to indication input through the TAP controller and output it, also, compares data read from the external memory with an expected value and judges the data. COPYRIGHT: (C)2009,JPO&INPIT
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